Test partition supported or not ?

[Laurent Louf]

Hello,

Reading the docs concerning the partitions for the ESP32 https://docs.espressif.com/projects/esp ... ables.html , I read the following

test (0x2) is a reserved subtype for factory test procedures. It is not currently supported by the esp-idf bootloader.

. So I decided to check if the config used to define the GPIO to trigger the booting from the test partition is used somewhere (BOOTLOADER_NUM_PIN_APP_TEST) and yes it is ! From bootloader_start.c :

Code: Select all

#ifdef CONFIG_BOOTLOADER_APP_TEST
        if (bootloader_common_check_long_hold_gpio(CONFIG_BOOTLOADER_NUM_PIN_APP_TEST, CONFIG_BOOTLOADER_HOLD_TIME_GPIO) == 1) {
            ESP_LOGI(TAG, "Detect a boot condition of the test firmware");
            if (bs->test.offset != 0) {
                boot_index = TEST_APP_INDEX;
                return boot_index;
            } else {
                ESP_LOGE(TAG, "Test firmware is not found in partition table");
                return INVALID_INDEX;
            }
        }
#endif

So this seems to be supported (for reference, I'm using esp-idf v3.1.2), is it just the documentation that hasn't been updated or am I missing something here ?

[ESP_Angus]

It is supported, this line in the documentation is out of date. Will fix ASAP.

[Laurent Louf]

Okay thanks for the quick reply, that's what I thought